NASDAQ, AEHR - Aehr Test Systems
Aehr Test develops, manufactures and sells systems which are designed to
reduce the cost of testing flash, dynamic random access memory ("DRAM"), and
other memory devices, and to perform reliability screening or burn-in of
complex logic and memory devices. These systems can be used to simultaneously
perform parallel testing and burn-in of packaged integrated circuits ("ICs"),
singulated bare die, or ICs still in wafer form. Leveraging its expertise as a
long-time leading provider of burn-in equipment, with over 2,500 systems
installed worldwide, the Company has developed and introduced several
innovative product families, including the FOXTM, MTX and MAX systems, and the
DiePakR carrier. The FOX system is a full wafer contact parallel test and
burn-in system designed to make contact with all pads of a wafer
simultaneously, thus enabling full wafer parallel test and burn-in. ...
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